Simulation of a Time-Domain OCT device for Through Silicon Via (TSV) characterization - Institut d'Optique Graduate School Access content directly
Conference Papers Year : 2018
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hal-04278047 , version 1 (09-11-2023)

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  • HAL Id : hal-04278047 , version 1

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Wolfgang Iff, Jean-Paul Hugonin, Christophe Sauvan, Mondher Besbes, Pierre Chavel, et al.. Simulation of a Time-Domain OCT device for Through Silicon Via (TSV) characterization. The European Optical Society Annual Meeting 2018 (EOSAM2018), Oct 2018, Delft, Netherlands. ⟨hal-04278047⟩
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