Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale) - Institut d'Optique Graduate School
Conference Papers Year : 2016

Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale)

Abstract

The effective Kerr and two photon absorption (TPA) nonlinear parameters of a nano-waveguide are characterized by means of a bi-directional top hat D-Scan technique. This approach requires a single beam and allows the measurement of the coupling efficiencies.

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Optics [physics.optics]

Fatima Pereira  : Connect in order to contact the contributor

https://hal-iogs.archives-ouvertes.fr/hal-01688012

Submitted on : Friday, January 19, 2018-9:14:59 AM

Last modification on : Friday, March 24, 2023-2:53:06 PM

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Dates and versions

hal-01688012 , version 1 (19-01-2018)

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Samuel Serna, Nicolas Dubreuil. Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale). Latin America Optics and Photonics Conference (LAOP), Aug 2016, Medellin, Colombia. pp.LW2A.2, ⟨10.1364/LAOP.2016.LW2A.2⟩. ⟨hal-01688012⟩

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IOGS CNRS PARISTECH LCFIO LCF_MANOLIA UNIV-PARIS-SACLAY GS-ENGINEERING GS-PHYSIQUE INSTITUT-SCIENCES-LUMIERE
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