Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale) - Archive ouverte HAL Access content directly
Conference Papers Year : 2016

Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale)

(1, 2) , (2)
1
2

Abstract

The effective Kerr and two photon absorption (TPA) nonlinear parameters of a nano-waveguide are characterized by means of a bi-directional top hat D-Scan technique. This approach requires a single beam and allows the measurement of the coupling efficiencies.
Not file

Dates and versions

hal-01688012 , version 1 (19-01-2018)

Identifiers

Cite

Samuel Serna, Nicolas Dubreuil. Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale). Latin America Optics and Photonics Conference (LAOP), Aug 2016, Medellin, Colombia. pp.LW2A.2, ⟨10.1364/LAOP.2016.LW2A.2⟩. ⟨hal-01688012⟩
60 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More