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Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale)

Abstract : The effective Kerr and two photon absorption (TPA) nonlinear parameters of a nano-waveguide are characterized by means of a bi-directional top hat D-Scan technique. This approach requires a single beam and allows the measurement of the coupling efficiencies.
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https://hal-iogs.archives-ouvertes.fr/hal-01688012
Contributor : Fatima Pereira <>
Submitted on : Friday, January 19, 2018 - 9:14:59 AM
Last modification on : Wednesday, September 16, 2020 - 5:46:54 PM

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Samuel Serna, Nicolas Dubreuil. Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale). Latin America Optics and Photonics Conference (LAOP), Aug 2016, Medellin, Colombia. pp.LW2A.2, ⟨10.1364/LAOP.2016.LW2A.2⟩. ⟨hal-01688012⟩

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