Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale)

Samuel Serna (1, 2) , Nicolas Dubreuil (2)

1 IEF - Institut d'électronique fondamentale
2 Laboratoire Charles Fabry / Manolia

The effective Kerr and two photon absorption (TPA) nonlinear parameters of a nano-waveguide are characterized by means of a bi-directional top hat D-Scan technique. This approach requires a single beam and allows the measurement of the coupling efficiencies.

Domaines: Optique [physics.optics]

Samuel Serna, Nicolas Dubreuil. Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale). Latin America Optics and Photonics Conference (LAOP), Aug 2016, Medellin, Colombia. pp.LW2A.2, ⟨10.1364/LAOP.2016.LW2A.2⟩. ⟨hal-01688012⟩