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Conference papers
Bi-directional top hat D-Scan for characterization of third order nonlinear waveguides (Orale)
Abstract : The effective Kerr and two photon absorption (TPA) nonlinear parameters of a nano-waveguide are characterized by means of a bi-directional top hat D-Scan technique. This approach requires a single beam and allows the measurement of the coupling efficiencies.
https://hal-iogs.archives-ouvertes.fr/hal-01688012
Contributor : Fatima Pereira <>
Submitted on : Friday, January 19, 2018 - 9:14:59 AM
Last modification on : Monday, June 22, 2020 - 4:00:04 PM
Contributor : Fatima Pereira <>
Submitted on : Friday, January 19, 2018 - 9:14:59 AM
Last modification on : Monday, June 22, 2020 - 4:00:04 PM
