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Article Dans Une Revue Applied optics Année : 2015

Wide-field full-field optical coherence microscopy for high axial resolution phase and amplitude imaging

Résumé

An original single-objective, full-field optical coherence microscopy system is reported that is capable of imaging both the phase and the amplitude of semi-transparent samples over a field of view of 17.5  mm×17.5  mm with an axial sectioning resolution of 1.5 μm. A special stack acquisition arrangement ensures optimal reachable imaging depth. Several phase-shifting interferometry algorithms for phase measurement with broadband light are compared theoretically and experimentally. Using the phase information, noninvasive depth-resolved topographic images of multilayer samples are produced to characterize each layer by measuring their defects and curvature with a nanometric scale precision. Using the amplitude information, tomographic images with a constant detection sensitivity of ∼80  dB through the entire field of view are obtained and applied to biological specimens.
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Dates et versions

hal-01218908 , version 1 (21-10-2015)

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Antoine Federici, Henrique Gutierrez da Costa, Jonas Ogien, Audrey K Ellerbee, Arnaud Dubois. Wide-field full-field optical coherence microscopy for high axial resolution phase and amplitude imaging. Applied optics, 2015, 54 (27), pp.8212-8220. ⟨10.1364/AO.54.008212⟩. ⟨hal-01218908⟩
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