Wide-field full-field optical coherence microscopy for high axial resolution phase and amplitude imaging

Antoine Federici 1 Henrique Gutierrez da Costa 2 Jonas Ogien 1 Audrey Ellerbee 3 Arnaud Dubois 1
1 Laboratoire Charles Fabry / Biophotonique
LCF - Laboratoire Charles Fabry
2 UFPR - Universidade Federal do Parana [Curitiba]
3 Stanford University [Stanford]
Abstract : An original single-objective, full-field optical coherence microscopy system is reported that is capable of imaging both the phase and the amplitude of semi-transparent samples over a field of view of 17.5  mm×17.5  mm with an axial sectioning resolution of 1.5 μm. A special stack acquisition arrangement ensures optimal reachable imaging depth. Several phase-shifting interferometry algorithms for phase measurement with broadband light are compared theoretically and experimentally. Using the phase information, noninvasive depth-resolved topographic images of multilayer samples are produced to characterize each layer by measuring their defects and curvature with a nanometric scale precision. Using the amplitude information, tomographic images with a constant detection sensitivity of ∼80  dB through the entire field of view are obtained and applied to biological specimens.
Type de document :
Article dans une revue
Applied optics, Optical Society of America, 2015, 54 (27), pp.8212-8220. 〈10.1364/AO.54.008212〉
Liste complète des métadonnées
https://hal-iogs.archives-ouvertes.fr/hal-01218908
Contributeur : Arnaud Dubois <>
Soumis le : mercredi 21 octobre 2015 - 17:43:53
Dernière modification le : mercredi 17 janvier 2018 - 13:34:02

Identifiants

Collections

IOGS | PARISTECH | LCF_BIOPHOTONIQUE | LCFIO | UNIV-PARIS-SACLAY

Citation

Antoine Federici, Henrique Gutierrez da Costa, Jonas Ogien, Audrey Ellerbee, Arnaud Dubois. Wide-field full-field optical coherence microscopy for high axial resolution phase and amplitude imaging. Applied optics, Optical Society of America, 2015, 54 (27), pp.8212-8220. 〈10.1364/AO.54.008212〉. 〈hal-01218908〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

208

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD