In-depth and surface characterization of Al/Mo/SiC multilayers - Institut d'Optique Graduate School
Conference Papers Year : 2010

In-depth and surface characterization of Al/Mo/SiC multilayers

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Optics [physics.optics]

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https://hal-iogs.archives-ouvertes.fr/hal-00598045

Submitted on : Friday, June 3, 2011-3:07:05 PM

Last modification on : Friday, April 19, 2024-4:18:54 PM

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hal-00598045 , version 1 (03-06-2011)

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  • HAL Id : hal-00598045 , version 1

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P. Jonnard, H. Hu, Jean-Michel André, Franck Delmotte, Evgueni Meltchakov, et al.. In-depth and surface characterization of Al/Mo/SiC multilayers. The 10th International Conference 
on the 
Physics of X-RayMultilayer Structures, Feb 2010, Big Sky Resort (Montana), United States. ⟨hal-00598045⟩

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