HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Conference papers

In-depth and surface characterization of Al/Mo/SiC multilayers

Document type :
Conference papers
Complete list of metadata

https://hal-iogs.archives-ouvertes.fr/hal-00598045
Contributor : Sébastien de Rossi Connect in order to contact the contributor
Submitted on : Friday, June 3, 2011 - 3:07:05 PM
Last modification on : Thursday, December 9, 2021 - 2:40:03 PM

Identifiers

  • HAL Id : hal-00598045, version 1

Citation

P. Jonnard, H. Hu, Jean-Michel André, Franck Delmotte, Evgueni Meltchakov, et al.. In-depth and surface characterization of Al/Mo/SiC multilayers. The 10th International Conference 
on the 
Physics of X-RayMultilayer Structures, Feb 2010, Big Sky Resort (Montana), United States. ⟨hal-00598045⟩

Share

Metrics

Record views

92