In-depth and surface characterization of Al/Mo/SiC multilayers - Institut d'Optique Graduate School Access content directly
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hal-00598045 , version 1 (03-06-2011)

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  • HAL Id : hal-00598045 , version 1

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P. Jonnard, H. Hu, Jean-Michel André, Franck Delmotte, Evgueni Meltchakov, et al.. In-depth and surface characterization of Al/Mo/SiC multilayers. The 10th International Conference 
on the 
Physics of X-RayMultilayer Structures, Feb 2010, Big Sky Resort (Montana), United States. ⟨hal-00598045⟩
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