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In-depth and surface characterization of Al/Mo/SiC multilayers

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https://hal-iogs.archives-ouvertes.fr/hal-00598045
Contributor : Sébastien de Rossi <>
Submitted on : Friday, June 3, 2011 - 3:07:05 PM
Last modification on : Tuesday, September 22, 2020 - 3:58:43 AM

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  • HAL Id : hal-00598045, version 1

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P. Jonnard, H. Hu, Jean-Michel André, Franck Delmotte, Evgueni Meltchakov, et al.. In-depth and surface characterization of Al/Mo/SiC multilayers. The 10th International Conference 
on the 
Physics of X-RayMultilayer Structures, Feb 2010, Big Sky Resort (Montana), United States. ⟨hal-00598045⟩

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