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Article Dans Une Revue Journal of the Optical Society of America B Année : 2009

Bragg diffraction in thin 2D refractive index modulated semiconductor samples

Résumé

A very simple model has been developed to describe the diffractive properties of a crossed grating structure of the refractive index formed by a thin transmission grating recorded in a Bragg reflector. When the Bragg condition of the transmission grating coincides with the band edge of the reflection grating seen as a one dimensional photonic crystal, the diffraction efficiency and wavelength selectivity of the transmission grating are highly enhanced and a Bragg diffraction regime can be obtained, even in very thin samples. The model can be used to design micrometric very efficient new diffracting devices for optical signal processing
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Dates et versions

hal-00554779 , version 1 (27-02-2012)

Identifiants

  • HAL Id : hal-00554779 , version 1

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Qiong He, Isabelle Zaquine, Gérald Roosen, Robert Frey. Bragg diffraction in thin 2D refractive index modulated semiconductor samples. Journal of the Optical Society of America B, 2009, 26 (3), pp.390-396. ⟨hal-00554779⟩
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