Bragg diffraction in thin 2D refractive index modulated semiconductor samples
Abstract
A very simple model has been developed to describe the diffractive properties of a crossed grating structure of the refractive index formed by a thin transmission grating recorded in a Bragg reflector. When the Bragg condition of the transmission grating coincides with the band edge of the reflection grating seen as a one dimensional photonic crystal, the diffraction efficiency and wavelength selectivity of the transmission grating are highly enhanced and a Bragg diffraction regime can be obtained, even in very thin samples. The model can be used to design micrometric very efficient new diffracting devices for optical signal processing
Domains
Optics [physics.optics]
Origin : Publisher files allowed on an open archive
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