Abstract : A very simple model has been developed to describe the diffractive properties of a crossed grating structure of the refractive index formed by a thin transmission grating recorded in a Bragg reflector. When the Bragg condition of the transmission grating coincides with the band edge of the reflection grating seen as a one dimensional photonic crystal, the diffraction efficiency and wavelength selectivity of the transmission grating are highly enhanced and a Bragg diffraction regime can be obtained, even in very thin samples. The model can be used to design micrometric very efficient new diffracting devices for optical signal processing
https://hal-iogs.archives-ouvertes.fr/hal-00554779 Contributor : Gilles PauliatConnect in order to contact the contributor Submitted on : Monday, February 27, 2012 - 4:47:54 PM Last modification on : Thursday, October 15, 2020 - 10:58:08 PM Long-term archiving on: : Monday, May 28, 2012 - 2:20:15 AM
Qiong He, Isabelle Zaquine, Gérald Roosen, Robert Frey. Bragg diffraction in thin 2D refractive index modulated semiconductor samples. Journal of the Optical Society of America B, Optical Society of America, 2009, 26 (3), pp.390-396. ⟨hal-00554779⟩