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Journal Articles Journal of the Optical Society of America B Year : 2009

Bragg diffraction in thin 2D refractive index modulated semiconductor samples

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Abstract

A very simple model has been developed to describe the diffractive properties of a crossed grating structure of the refractive index formed by a thin transmission grating recorded in a Bragg reflector. When the Bragg condition of the transmission grating coincides with the band edge of the reflection grating seen as a one dimensional photonic crystal, the diffraction efficiency and wavelength selectivity of the transmission grating are highly enhanced and a Bragg diffraction regime can be obtained, even in very thin samples. The model can be used to design micrometric very efficient new diffracting devices for optical signal processing
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Dates and versions

hal-00554779 , version 1 (27-02-2012)

Identifiers

  • HAL Id : hal-00554779 , version 1

Cite

Qiong He, Isabelle Zaquine, Gérald Roosen, Robert Frey. Bragg diffraction in thin 2D refractive index modulated semiconductor samples. Journal of the Optical Society of America B, 2009, 26 (3), pp.390-396. ⟨hal-00554779⟩
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