Bragg diffraction in thin 2D refractive index modulated semiconductor samples

Qiong He (1) , Isabelle Zaquine (1) , Gérald Roosen (2) , Robert Frey (2)

1 TSI - Département Traitement du Signal et des Images
2 Laboratoire Charles Fabry de l'Institut d'Optique / Manolia

A very simple model has been developed to describe the diffractive properties of a crossed grating structure of the refractive index formed by a thin transmission grating recorded in a Bragg reflector. When the Bragg condition of the transmission grating coincides with the band edge of the reflection grating seen as a one dimensional photonic crystal, the diffraction efficiency and wavelength selectivity of the transmission grating are highly enhanced and a Bragg diffraction regime can be obtained, even in very thin samples. The model can be used to design micrometric very efficient new diffracting devices for optical signal processing

Domains: Physics [physics]; Physics [physics]; Optics [physics.optics]

Qiong He, Isabelle Zaquine, Gérald Roosen, Robert Frey. Bragg diffraction in thin 2D refractive index modulated semiconductor samples. Journal of the Optical Society of America B, 2009, 26 (3), pp.390-396. ⟨hal-00554779⟩