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Journal articles
Bragg diffraction in thin 2D refractive index modulated semiconductor samples
Abstract : A very simple model has been developed to describe the diffractive properties of a crossed grating structure of the refractive index formed by a thin transmission grating recorded in a Bragg reflector. When the Bragg condition of the transmission grating coincides with the band edge of the reflection grating seen as a one dimensional photonic crystal, the diffraction efficiency and wavelength selectivity of the transmission grating are highly enhanced and a Bragg diffraction regime can be obtained, even in very thin samples. The model can be used to design micrometric very efficient new diffracting devices for optical signal processing
Cited literature [22 references]
https://hal-iogs.archives-ouvertes.fr/hal-00554779
Contributor : Gilles Pauliat Connect in order to contact the contributor
Submitted on : Monday, February 27, 2012 - 4:47:54 PM
Last modification on : Thursday, October 15, 2020 - 10:58:08 PM
Long-term archiving on: : Monday, May 28, 2012 - 2:20:15 AM
Contributor : Gilles Pauliat Connect in order to contact the contributor
Submitted on : Monday, February 27, 2012 - 4:47:54 PM
Last modification on : Thursday, October 15, 2020 - 10:58:08 PM
Long-term archiving on: : Monday, May 28, 2012 - 2:20:15 AM
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