 |
 |
Journal articles
Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N- and O-electronic shell absorption regions
Regina Soufli
1
Franck Delmotte
2
Julia Meyer-Ilse
3
Farhad Salmassi
3
Nicolai Brejnholt
1
Sonny Massahi
4
David Girou
4
Finn Christensen
4
Eric Gullikson
3
Eric Gullikson 3
Author
1
LLNL - Lawrence Livermore National Laboratory (7000 East Avenue • Livermore, CA 94550 - United States)
2
Laboratoire Charles Fabry / Optique XUV (France)
- LCF - Laboratoire Charles Fabry (2 avenue Augustin Fresnel, 91127 Palaiseau Cedex - France)
- UP11 - Université Paris-Sud - Paris 11 (Bâtiment 300 - 91405 Orsay cedex - France)
- IOGS - Institut d'Optique Graduate School (2 avenue Augustin Fresnel, 91127 Palaiseau Cedex - France)
- CNRS - Centre National de la Recherche Scientifique : UMR8501 (France)
3
CXRO - Center for X-Ray Optics [LBNL Berkeley] (Berkeley, California 94720 - United States)
- LBNL - Lawrence Berkeley National Laboratory [Berkeley] (1 Cyclotron Rd. MS 50A-1148, Berkeley, CA 94720 - United States)
4
Danish Technical University (Denmark)
Document type :
Journal articles
Domain :
Complete list of metadata
https://hal-iogs.archives-ouvertes.fr/hal-03349801
Contributor : Marie-Laure Edwards Connect in order to contact the contributor
Submitted on : Monday, September 20, 2021 - 5:48:10 PM
Last modification on : Tuesday, September 21, 2021 - 3:40:33 AM
Contributor : Marie-Laure Edwards Connect in order to contact the contributor
Submitted on : Monday, September 20, 2021 - 5:48:10 PM
Last modification on : Tuesday, September 21, 2021 - 3:40:33 AM
Links full text
Identifiers
- HAL Id : hal-03349801, version 1
- DOI : 10.1063/1.5067366
Collections
IOGS | PARISTECH | LCF_XUV | CNRS | GS-ENGINEERING | LCFIO | INSTITUT-SCIENCES-LUMIERE
Citation
Regina Soufli, Franck Delmotte, Julia Meyer-Ilse, Farhad Salmassi, Nicolai Brejnholt, et al.. Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N- and O-electronic shell absorption regions. Journal of Applied Physics, American Institute of Physics, 2019, 125 (8), pp.085106. ⟨10.1063/1.5067366⟩. ⟨hal-03349801⟩
Metrics
Record views