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Bi-directional top-hat D-Scan: single beam accurate characterization of nonlinear waveguides

Abstract : The characterization of a third-order nonlinear integrated waveguide is reported for the first time by means of a top-hat dispersive-scan (D-Scan) technique, a temporal analog of the top-hat Z-Scan. With a single laser beam, and by carrying two counterdirectional nonlinear transmissions to assess the input and output coupling efficiencies, a novel procedure is described leading to accurate measurement of the TPA figure of merit, the effective two-photon absorption (TPA), and optical Kerr (including the sign) coefficients. The technique is validated in a silicon strip waveguide for which the effective nonlinear coefficients are measured with an accuracy of ±10%.
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https://hal-iogs.archives-ouvertes.fr/hal-01575832
Contributor : Nicolas Dubreuil <>
Submitted on : Monday, August 21, 2017 - 5:41:04 PM
Last modification on : Tuesday, October 6, 2020 - 4:26:41 PM

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Samuel Serna, Nicolas Dubreuil. Bi-directional top-hat D-Scan: single beam accurate characterization of nonlinear waveguides. Optics Letters, Optical Society of America - OSA Publishing, 2017, 42 (16), pp.3072-3075. ⟨10.1364/OL.42.003072⟩. ⟨hal-01575832⟩

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