Oxide-free InP-on-Silicon-on-Insulator Nanopatterned Waveguides: Propagation Losses Assessment Through End-Fire and Internal Probe Measurements

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Journal of Lightwave Technology, Institute of Electrical and Electronics Engineers (IEEE)/Optical Society of America(OSA), 2014, 32 (6), pp.1048-1053. 〈10.1109/JLT.2013.2296783〉
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Contributeur : Marie-Laure Edwards <>
Soumis le : vendredi 29 juillet 2016 - 15:13:28
Dernière modification le : jeudi 11 janvier 2018 - 06:26:44

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C. Pang, Henri Benisty, Mondher Besbes, Xavier Pommarede, Anne Talneau. Oxide-free InP-on-Silicon-on-Insulator Nanopatterned Waveguides: Propagation Losses Assessment Through End-Fire and Internal Probe Measurements. Journal of Lightwave Technology, Institute of Electrical and Electronics Engineers (IEEE)/Optical Society of America(OSA), 2014, 32 (6), pp.1048-1053. 〈10.1109/JLT.2013.2296783〉. 〈hal-01350053〉

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