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Journal articles
Oxide-free InP-on-Silicon-on-Insulator Nanopatterned Waveguides: Propagation Losses Assessment Through End-Fire and Internal Probe Measurements
C. Pang 1
Author
Henri Benisty 1
Author IdHAL : henri-benisty
Mondher Besbes 1
Author
Xavier Pommarede 2
Author
Anne Talneau 2
Author IdHAL : anne-talneau
1
Laboratoire Charles Fabry / Naphel (France)
- LCF - Laboratoire Charles Fabry (2 avenue Augustin Fresnel, 91127 Palaiseau Cedex - France)
- UP11 - Université Paris-Sud - Paris 11 (Bâtiment 300 - 91405 Orsay cedex - France)
- CNRS - Centre National de la Recherche Scientifique : UMR8501 (France)
- IOGS - Institut d'Optique Graduate School (2 avenue Augustin Fresnel, 91127 Palaiseau Cedex - France)
2
LPN - Laboratoire de photonique et de nanostructures (Route de Nozay 91460 MARCOUSSIS - France)
- CNRS - Centre National de la Recherche Scientifique : UPR20 (France)
Document type :
Journal articles
Domain :
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https://hal-iogs.archives-ouvertes.fr/hal-01350053
Contributor : Marie-Laure Edwards Connect in order to contact the contributor
Submitted on : Friday, July 29, 2016 - 3:13:28 PM
Last modification on : Tuesday, December 15, 2020 - 8:56:03 AM
Contributor : Marie-Laure Edwards Connect in order to contact the contributor
Submitted on : Friday, July 29, 2016 - 3:13:28 PM
Last modification on : Tuesday, December 15, 2020 - 8:56:03 AM
Identifiers
- HAL Id : hal-01350053, version 1
- DOI : 10.1109/JLT.2013.2296783
Collections
IOGS | CNRS | LCF_NAPHEL | PARISTECH | LCFIO
Citation
C. Pang, Henri Benisty, Mondher Besbes, Xavier Pommarede, Anne Talneau. Oxide-free InP-on-Silicon-on-Insulator Nanopatterned Waveguides: Propagation Losses Assessment Through End-Fire and Internal Probe Measurements. Journal of Lightwave Technology, Institute of Electrical and Electronics Engineers (IEEE)/Optical Society of America(OSA), 2014, 32 (6), pp.1048-1053. ⟨10.1109/JLT.2013.2296783⟩. ⟨hal-01350053⟩
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