Oxide-free InP-on-Silicon-on-Insulator Nanopatterned Waveguides: Propagation Losses Assessment Through End-Fire and Internal Probe Measurements

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https://hal-iogs.archives-ouvertes.fr/hal-01350053
Contributor : Marie-Laure Edwards <>
Submitted on : Friday, July 29, 2016 - 3:13:28 PM
Last modification on : Wednesday, January 31, 2018 - 3:04:01 PM

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C. Pang, Henri Benisty, Mondher Besbes, Xavier Pommarede, Anne Talneau. Oxide-free InP-on-Silicon-on-Insulator Nanopatterned Waveguides: Propagation Losses Assessment Through End-Fire and Internal Probe Measurements. Journal of Lightwave Technology, Institute of Electrical and Electronics Engineers (IEEE)/Optical Society of America(OSA), 2014, 32 (6), pp.1048-1053. ⟨10.1109/JLT.2013.2296783⟩. ⟨hal-01350053⟩

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