Skip to Main content Skip to Navigation
Journal articles

Submicron-diameter semiconductor pillar microcavities with very high quality factors

Abstract : Pillar microcavities are subject to two common fabrication artifacts: Bragg mirror corrugation and oxide deposit cladding. In this letter the authors investigate the impact of these features on the quality factor. A quasiperiodic variation of the quality factor as a function of the pillar diameter is experimentally observed and well described by theory. Moreover, observation of quality factors in excess of 1500, close to the theoretical limit, is reported for 600-nm-diameter GaAs micropillars bounded by AlGaAs/GaAs Bragg mirrors.
Document type :
Journal articles
Complete list of metadatas

Cited literature [1 references]  Display  Hide  Download

https://hal-iogs.archives-ouvertes.fr/hal-00877855
Contributor : Fatima Pereira <>
Submitted on : Tuesday, October 29, 2013 - 11:50:17 AM
Last modification on : Wednesday, September 16, 2020 - 5:42:43 PM
Long-term archiving on: : Friday, April 7, 2017 - 6:35:12 PM

File

18B_00200.pdf
Publisher files allowed on an open archive

Identifiers

Collections

Citation

Guillaume Lecamp, Jean-Paul Hugonin, Philippe Lalanne, Rémy Braive, Spyros Varoutis, et al.. Submicron-diameter semiconductor pillar microcavities with very high quality factors. Applied Physics Letters, American Institute of Physics, 2007, 90 (9), pp.091120. ⟨10.1063/1.2711186⟩. ⟨hal-00877855⟩

Share

Metrics

Record views

943

Files downloads

486