Intracavity testing of KTP crystals for second harmonic generation at 532 nm - Archive ouverte HAL Access content directly
Journal Articles Applied optics Year : 1999

Intracavity testing of KTP crystals for second harmonic generation at 532 nm

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Abstract

We have developed a diode-pumped Nd:YVO4 cw laser for testing KTiOPO4 crystals designed for intracavity second-harmonic generation at 532 nm. We demonstrate that this source is extremely sensitive to defects inside the crystal, inducing losses at 1064 nm and an index mismatch between fundamental and harmonic waves.
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Dates and versions

hal-00761393 , version 1 (05-12-2012)

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  • HAL Id : hal-00761393 , version 1

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Hervé Albrecht, François Balembois, D. Lupinski, Patrick Georges, Alain Brun. Intracavity testing of KTP crystals for second harmonic generation at 532 nm. Applied optics, 1999, 38 (12), pp.2536-2539. ⟨hal-00761393⟩
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