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Conference papers

Metrology instrumentation at ESPCI

Arnaud Dubois 1 Vincent Loriette 2 A.C. Boccara 3
1 LSLP - Laboratoire de Spectroscopie en Lumière Polarisée
2 ESPCI Paris - Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris
3 LOP - Laboratoire d'Optique Physique (UPR0005)
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Conference papers
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https://hal-iogs.archives-ouvertes.fr/hal-00674824
Contributor : Arnaud Dubois Connect in order to contact the contributor
Submitted on : Tuesday, February 28, 2012 - 11:45:47 AM
Last modification on : Thursday, November 18, 2021 - 4:02:38 AM

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  • HAL Id : hal-00674824, version 1

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UPMC | CNRS | IOGS | PARISTECH | SORBONNE-UNIVERSITE | PSL | ESPCI-PSL | ESPCI

Citation

Arnaud Dubois, Vincent Loriette, A.C. Boccara. Metrology instrumentation at ESPCI. International Workshop on Metrology for X-ray and Neutron Optics, Mar 2000, Chicago, United States. ⟨hal-00674824⟩

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