Characterization of deep-level compensation ratio through picosecond four-wave mixing on a transient reflection grating

Arunas Kadys; Philippe Delaye; Gérald Roosen; Kestutis Jarašiunas

Journal Articles Semiconductor Science and Technology Year : 2007

Characterization of deep-level compensation ratio through picosecond four-wave mixing on a transient reflection grating

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1
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Arunas Kadys

Function : Author

Institute of Materials Science and Applied Research

Philippe Delaye

Function : Author
PersonId : 756
IdHAL : philippe-delaye
ORCID : 0000-0002-4741-656X
IdRef : 155962892

Laboratoire Charles Fabry de l'Institut d'Optique / Manolia

CV

Gérald Roosen

Function : Author
PersonId : 920471

Laboratoire Charles Fabry de l'Institut d'Optique / Manolia

Kestutis Jarašiunas

Function : Author

Institute of Materials Science and Applied Research

Domains

Physics [physics] Physics [physics] Optics [physics.optics]

Marie-Laure Edwards : Connect in order to contact the contributor

https://hal-iogs.archives-ouvertes.fr/hal-00673986

Submitted on : Friday, February 24, 2012-4:12:30 PM

Last modification on : Tuesday, February 7, 2023-2:44:47 PM

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hal-00673986 , version 1 (24-02-2012)

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HAL Id : hal-00673986 , version 1

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Arunas Kadys, Philippe Delaye, Gérald Roosen, Kestutis Jarašiunas. Characterization of deep-level compensation ratio through picosecond four-wave mixing on a transient reflection grating. Semiconductor Science and Technology, 2007, 22, pp.1044-1052. ⟨hal-00673986⟩

Characterization of deep-level compensation ratio through picosecond four-wave mixing on a transient reflection grating

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