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Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach

Anouk Galtayries 1 M.H. Hu 2 Karine Le Guen 2 Jean-Michel André 2 Evgueni Meltchakov 3 Christophe Hecquet 3 Franck Delmotte 3 
1 LPCS - Laboratoire de Physico-Chimie des Surfaces
2 LCPMR - Laboratoire de Chimie Physique - Matière et Rayonnement
3 Laboratoire Charles Fabry de l'Institut d'Optique / Scop
LCFIO - Laboratoire Charles Fabry de l'Institut d'Optique
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https://hal-iogs.archives-ouvertes.fr/hal-00648606
Contributor : Sébastien de Rossi Connect in order to contact the contributor
Submitted on : Tuesday, December 6, 2011 - 10:20:45 AM
Last modification on : Sunday, June 26, 2022 - 11:54:59 AM

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  • HAL Id : hal-00648606, version 1

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Citation

Anouk Galtayries, M.H. Hu, Karine Le Guen, Jean-Michel André, Evgueni Meltchakov, et al.. Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach. Surface and Interface Analysis, Wiley-Blackwell, 2010, 42 (6-7), pp.653-657. ⟨hal-00648606⟩

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