Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach - Institut d'Optique Graduate School Access content directly
Journal Articles Surface and Interface Analysis Year : 2010

Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach

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Optics [physics.optics]

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https://hal-iogs.archives-ouvertes.fr/hal-00648606

Submitted on : Tuesday, December 6, 2011-10:20:45 AM

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hal-00648606 , version 1 (06-12-2011)

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  • HAL Id : hal-00648606 , version 1

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Anouk Galtayries, M.H. Hu, Karine Le Guen, Jean-Michel André, Evgueni Meltchakov, et al.. Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach. Surface and Interface Analysis, 2010, 42 (6-7), pp.653-657. ⟨hal-00648606⟩

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