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Bragg diffraction regime in thin semiconductor 2D refractive index gratings

Qiong He 1 Isabelle Zaquine 1 Régis André 2 Gérald Roosen 3 Robert Frey 3 
1 TSI - Département Traitement du Signal et des Images
2 NPSC - Nanophysique et Semiconducteurs
NEEL - Institut Néel
3 Laboratoire Charles Fabry de l'Institut d'Optique / Manolia
LCFIO - Laboratoire Charles Fabry de l'Institut d'Optique
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Conference papers
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https://hal-iogs.archives-ouvertes.fr/hal-00587702
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Submitted on : Thursday, April 21, 2011 - 11:48:22 AM
Last modification on : Sunday, June 26, 2022 - 11:53:45 AM

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  • HAL Id : hal-00587702, version 1

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Qiong He, Isabelle Zaquine, Régis André, Gérald Roosen, Robert Frey. Bragg diffraction regime in thin semiconductor 2D refractive index gratings. Topical Meeting Photorefractive Materials, Effects, and Devices Control of Light and Matter, Jun 2009, Bad-Honnef, Germany. pp.T6-4. ⟨hal-00587702⟩

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