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Probing multilayer stack reflectors by low coherence interferometry in extreme ultraviolet

Sébastien de Rossi 1 Denis Joyeux 1 Pierre Chavel 1 Nelson de Oliveira 2 Marieke Richard 3 Christophe Constancias 3 Jean-Yves Robic 3
1 Laboratoire Charles Fabry de l'Institut d'Optique / Scop
LCFIO - Laboratoire Charles Fabry de l'Institut d'Optique
2 SSOLEIL - Synchrotron SOLEIL
3 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
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Conference papers
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https://hal-iogs.archives-ouvertes.fr/hal-00575955
Contributor : Sébastien de Rossi <>
Submitted on : Friday, March 11, 2011 - 3:08:30 PM
Last modification on : Wednesday, September 16, 2020 - 5:42:39 PM

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  • HAL Id : hal-00575955, version 1

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CEA | CNRS | LCF_SCOP | LCFIO | PARISTECH | IOGS | DRT | SYNCHROTRON-SOLEIL | LETI | CEA-GRE

Citation

Sébastien de Rossi, Denis Joyeux, Pierre Chavel, Nelson de Oliveira, Marieke Richard, et al.. Probing multilayer stack reflectors by low coherence interferometry in extreme ultraviolet. The 9th International Conference 
on the 
Physics of X-Ray Multilayer Structures, Feb 2008, Big Sky Resort, United States. ⟨hal-00575955⟩

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