Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques - Archive ouverte HAL Access content directly
Journal Articles Surface Science Year : 2007

Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques

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Physics [physics] Physics [physics] Optics [physics.optics]

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Submitted on : Friday, March 11, 2011-12:18:06 PM

Last modification on : Tuesday, December 27, 2022-3:54:05 PM

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hal-00575880 , version 1 (11-03-2011)

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  • HAL Id : hal-00575880 , version 1

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Hélène Maury, Philippe Jonnard, Jean-Michel André, Julien Gautier, Françoise Bridou, et al.. Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques. Surface Science, 2007, 601 (11), pp.2315-2322. ⟨hal-00575880⟩

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