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Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques

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https://hal-iogs.archives-ouvertes.fr/hal-00575880
Contributor : Sébastien de Rossi Connect in order to contact the contributor
Submitted on : Friday, March 11, 2011 - 12:18:06 PM
Last modification on : Friday, December 10, 2021 - 3:55:47 AM

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  • HAL Id : hal-00575880, version 1

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Hélène Maury, Philippe Jonnard, Jean-Michel André, Julien Gautier, Françoise Bridou, et al.. Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques. Surface Science, Elsevier, 2007, 601 (11), pp.2315-2322. ⟨hal-00575880⟩

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