Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques - Institut d'Optique Graduate School
Journal Articles Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces Year : 2007

Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques

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Optics [physics.optics]

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https://hal-iogs.archives-ouvertes.fr/hal-00575880

Submitted on : Friday, March 11, 2011-12:18:06 PM

Last modification on : Thursday, April 11, 2024-1:08:14 PM

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hal-00575880 , version 1 (11-03-2011)

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  • HAL Id : hal-00575880 , version 1

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Hélène Maury, Philippe Jonnard, Jean-Michel André, Julien Gautier, Françoise Bridou, et al.. Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques. Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2007, 601 (11), pp.2315-2322. ⟨hal-00575880⟩

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