X-ray spectroscopic application of Cr/Sc periodic multilayers - Archive ouverte HAL Access content directly
Journal Articles Applied Physics Letters Year : 2007

X-ray spectroscopic application of Cr/Sc periodic multilayers

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Abstract

The use of Cr/Sc multilayer interferential mirrors (MIMs) in optical systems such as x-ray microscopes or telescopes have been reported for the water window (between C K- and O K-absorption edges). However, their possibilities in spectroscopic application have never been described in the literature. The purpose of the paper is to report for the first time on the performances of Cr/Sc MIMs as Bragg dispersive devices for the analysis in wavelength dispersive spectrometry of samples containing N or Sc atoms. The possibility to distinguish the chemical state of the emitting N or Sc atoms is evidenced by using Johan-type and double-crystal spectrometers.
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Dates and versions

hal-00575878 , version 1 (06-04-2012)

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K. Le Guen, Hélène Maury, Jean-Michel André, Philippe Jonnard, Aurélie Hardouin, et al.. X-ray spectroscopic application of Cr/Sc periodic multilayers. Applied Physics Letters, 2007, 91, pp.234104. ⟨10.1063/1.2821379⟩. ⟨hal-00575878⟩
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