Scattering scanning near-field microscopy of ZnO nanowires with a highly doped-semiconductor probe tip (poster) - Archive ouverte HAL Access content directly
Conference Papers Year : 2017

Scattering scanning near-field microscopy of ZnO nanowires with a highly doped-semiconductor probe tip (poster)

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Dates and versions

hal-01709025 , version 1 (14-02-2018)

Identifiers

  • HAL Id : hal-01709025 , version 1

Cite

Emilie Sakat, Valeria Giliberti, Leonetta Baldassarre, Monica Bollani, M. Virginia Altoe, et al.. Scattering scanning near-field microscopy of ZnO nanowires with a highly doped-semiconductor probe tip (poster). The 8th International Conference on Surface Plasmon Photonics (SPP8), May 2017, Taïwan, China. pp.345. ⟨hal-01709025⟩
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