G. Charatis, G. E. Busch, C. L. Shepard, P. M. Campbell, and M. D. Rosen, HYDRODYNAMIC ASPECTS OF SELENIUM X-RAY LASER TARGETS, Le Journal de Physique Colloques, vol.47, issue.C6, pp.89-98, 1986.
DOI : 10.1051/jphyscol:1986612

URL : https://hal.archives-ouvertes.fr/jpa-00225855

M. K. Prasad, K. G. Estabrook, J. A. Harte, R. S. Craxton, R. A. Bosch et al., Holographic interferograms from laser fusion code simulations, Physics of Fluids B: Plasma Physics, vol.4, issue.6, pp.1569-1575, 1992.
DOI : 10.1063/1.860464

S. Chakrabarti, D. M. Cotton, J. S. Vickers, and B. C. Bush, Self-compensating, all-reflection interferometer, Applied Optics, vol.33, issue.13, pp.2596-2602, 1994.
DOI : 10.1364/AO.33.002596

J. Svatos, D. Joyeux, D. Phalippou, and F. Polack, Soft-x-ray interferometer for measuring the refractive index of materials, Optics Letters, vol.18, issue.16, pp.1367-1369, 1993.
DOI : 10.1364/OL.18.001367

D. Moreno, J. E. Ress, A. S. Trebes, F. Wan, and . Weber, Electron density measurements of high density plasmas using soft X-ray laser interferometry, Phys. Rev. Lett, vol.74, pp.3991-3994, 1995.

P. Celliers, F. Weber, L. B. Da-silva, T. W. Barbee, J. et al., Fringe formation and coherence of a soft-x-ray laser beam illuminating a Mach???Zehnder interferometer, Optics Letters, vol.20, issue.18, 1907.
DOI : 10.1364/OL.20.001907

D. G. Stearns, N. M. Ceglio, A. M. Hawryluk, M. B. Stearns, A. K. Petford-long et al., TEM and X-ray analysis of multilayer mirrors and beamsplitters, Multilayer Structures and Laboratory X-Ray Laser Research Proc. SPIE, pp.91-98, 1987.

N. M. Ceglio, Revolution in X-ray optics, Journal of X-Ray Science and Technology, vol.1, issue.1, pp.7-78, 1989.
DOI : 10.1016/0895-3996(89)90031-1

T. Haga, M. C. Tinene, A. Ozawa, Y. Utsumi, S. Itabashi et al., <title>Fabrication of semitransparent multilayer polarizer and its application to soft x-ray ellipsometer</title>, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III, pp.13-27, 1999.
DOI : 10.1117/12.371092

F. Bridou and B. Pardo, Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometry, Journal of Optics, vol.21, issue.4, pp.183-191, 1990.
DOI : 10.1088/0150-536X/21/4/005

B. L. Henke, E. M. Gullikson, and J. C. Davis, X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92, Atomic Data and Nuclear Data Tables, vol.54, issue.2, pp.181-342, 1993.
DOI : 10.1006/adnd.1993.1013

S. Ogura, M. Niibe, Y. Watanabe, M. Hayashida, and T. Iizuka, <title>Comparison Among Multilayer Soft X-Ray Mirrors Fabricated By Electron Beam, Dc-, Rf-Magnetron Sputtering And Ion Beam Sputtering Deposition</title>, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, pp.140-148, 1988.
DOI : 10.1117/12.948781

T. W. Barbee, J. C. Rife, W. R. Hunter, M. P. Kowalski, R. G. Cruddace et al., Long-term stability of a Mo/Si multilayer structure, Applied Optics, vol.32, issue.25, pp.4852-4854, 1993.
DOI : 10.1364/AO.32.004852

K. Holloway, K. Ba, R. Do, and . Sinclair, Interfacial reactions on annealing molybdenum???silicon multilayers, Journal of Applied Physics, vol.65, issue.2, pp.474-80, 1989.
DOI : 10.1063/1.343425

D. G. Steams, R. S. Rosen, and S. P. Vernon, Fabrication of high-reflectance Mo-Si multilayer mirrors by planarmagnetron sputtering, J. Vac. Sci. Technol. A, vol.9, pp.2662-2669, 1991.

C. Khan-malek, J. Susini, A. Madouri, M. Ouahabi, R. Rivoira et al., Semitransparent soft X-ray multilayer mirrors, Opt. Eng, vol.29, pp.597-602, 1990.

F. Calisti, M. Delmotte, G. Idir, S. De-lachèze-murel, M. F. Le-pape et al., Line shape measurement of a Ni-like silver X-ray laser by mean of soft X-ray Fourier-transform spectroscopy