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Journal Articles Applied optics Year : 2007

Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation

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Abstract

In the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the Berlin electron-storage ring BESSY II, a procedure has been developed to investigate the dependence of vacuum-ultraviolet reflection on polarization. It is based on characterizing the elliptically polarized synchrotron radiation at PTB's normal-incidence monochromator beamline for reflectometry by means of polarization-sensitive photodetectors. For this purpose, the polarization dependency in the detector responsivity was determined at a small, low, solid angle of acceptance for the synchrotron radiation, i.e., within the orbital plane of the storage ring where the degree of linear polarization is known to be almost 100%. Our method allows the polarization dependence of reflection samples to be measured with relative standard uncertainties ranging from 2.4% to 11% in the spectral range between 60 and 160 nm. The method has been applied to the optimization of polarizing mirrors at the Lyman-α wavelength of 121.6 nm.
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Dates and versions

hal-00575921 , version 1 (08-03-2012)

Identifiers

  • HAL Id : hal-00575921 , version 1

Cite

Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth, et al.. Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation. Applied optics, 2007, 46 (32), pp.7797-7804. ⟨hal-00575921⟩
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