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Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation

Abstract : In the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the Berlin electron-storage ring BESSY II, a procedure has been developed to investigate the dependence of vacuum-ultraviolet reflection on polarization. It is based on characterizing the elliptically polarized synchrotron radiation at PTB's normal-incidence monochromator beamline for reflectometry by means of polarization-sensitive photodetectors. For this purpose, the polarization dependency in the detector responsivity was determined at a small, low, solid angle of acceptance for the synchrotron radiation, i.e., within the orbital plane of the storage ring where the degree of linear polarization is known to be almost 100%. Our method allows the polarization dependence of reflection samples to be measured with relative standard uncertainties ranging from 2.4% to 11% in the spectral range between 60 and 160 nm. The method has been applied to the optimization of polarizing mirrors at the Lyman-α wavelength of 121.6 nm.
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Contributor : Sébastien de Rossi Connect in order to contact the contributor
Submitted on : Thursday, March 8, 2012 - 6:22:38 PM
Last modification on : Wednesday, July 6, 2022 - 10:42:19 AM
Long-term archiving on: : Thursday, June 14, 2012 - 4:23:44 PM


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  • HAL Id : hal-00575921, version 1



Alexander Gottwald, Françoise Bridou, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Simone Kroth, et al.. Polarization-dependent vacuum-ultraviolet reflectometry using elliptically polarized synchrotron radiation. Applied optics, Optical Society of America, 2007, 46 (32), pp.7797-7804. ⟨hal-00575921⟩



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