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Article Dans Une Revue X-Ray Spectrometry Année : 2004

La/B4C small period multilayer interferential mirrors for the analysis of boron

Résumé

A La/B4C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength-dispersive x-ray spectrometry at a large Bragg angle (close to 45°). The structure of the mirror has been characterized by grazing incidence x-ray reflectometry, and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. A spectrometric measurement shows that the La/B4C mirror has improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B4C mirrors, and by a factor of 4 with respect to a lead stearate crystal.
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Dates et versions

hal-01232846 , version 1 (24-11-2015)

Identifiants

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J.-M André, Philippe Jonnard, C Michaelsen, J Wiesmann, F Bridou, et al.. La/B4C small period multilayer interferential mirrors for the analysis of boron. X-Ray Spectrometry, 2004, 34 (3), pp.203-206. ⟨10.1002/xrs.793⟩. ⟨hal-01232846⟩
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