La/B4C small period multilayer interferential mirror for the analysis of boron

Abstract : An La/B4C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength-dispersive x-ray spectrometry at a large Bragg angle (close to 45°). The structure of the mirror was characterized by grazing incidence x-ray reflectometry and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. Spectrometric measurements showed that the La/B4C mirror improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B4C mirrors and by a factor of 4 with respect to a lead stearate crystal.
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Submitted on : Friday, March 11, 2011 - 10:59:31 AM
Last modification on : Wednesday, May 15, 2019 - 4:08:37 AM

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  • HAL Id : hal-00575807, version 1

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Jean-Michel André, Philippe Jonnard, C. Michaelsen, J. Wiesmann, Françoise Bridou, et al.. La/B4C small period multilayer interferential mirror for the analysis of boron. X-Ray Spectrometry, Wiley, 2005, 34 (3), pp.203-206. ⟨hal-00575807⟩

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