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 Test and dEpendability of microelectronic integrated SysTems

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Transient analysis Noise measurement Digital ATE Test efficiency Fault simulation Soft errors Indirect testing Testing Radiation hardening Process variability Analog/RF integrated circuits Circuit faults SEU Neutrons ATPG Fiabilité Single event upset SEU Combinational circuits Switches Phase noise Computer architecture Scan Attacks Countermeasure Stream Cipher Test One bit acquisition SER Logic testing Software Hardware security Analog signals Scan Encryption Fault tolerance Power supplies Microprocessors Approximate computing Integrated circuit modeling Clocks Test and Security BIST 3D integration Machine Learning Diagnosis Through-silicon vias Hardware Security Transient faults Alternate testing ZigBee Soft error JTAG Monitoring Particle detector Heavy ions Logic gates RF test Protons Random access memory Flip-flops Machine-learning algorithms Fault Injection Delays Security Radiation Hardware Trojan Integrated circuits FDSOI Integrated circuit reliability Transistors Laser Power demand Cross section Reliability Test cost reduction Multiple cell upset MCU COTS Education Diffusion model Integrated circuit design SRAM Analytical models Memories Libraries Integrated circuit testing Fault attacks Fault injection Computational modeling RF integrated circuits Ensemble methods Approximate Computing Context Saving 1-bit acquisition Simulation Atmospheric neutrons Digital signal processing OQPSK Hardware Microprocessor chips Power consumption Automatic test pattern generation Estimation Fault tolerant systems