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 Test and dEpendability of microelectronic integrated SysTems

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Microprocessor chips Memories Integrated circuit reliability Fault tolerant systems Microprocessors Machine-learning algorithms Hardware Trojan Integrated circuit modeling RF test Diagnosis Flip-flops Laser ZigBee Circuit faults Noise measurement Computational modeling Databases Hardware Security 3D integration Design for testability Automatic test pattern generation Software Analog/RF integrated circuits Protons COTS Single event upset SEU Indirect testing 1-bit acquisition Integrated circuit testing Libraries JTAG SRAM Delays Cryptography Estimation Logic testing Soft errors Clocks Power demand Neutrons Dynamic test Transient analysis Dependability Analog signals Testing Fault tolerance Reliability Computer architecture Integrated circuits Scan Attacks Countermeasure Context Saving Radiation Data retention Hardware security Cross section Digital signal processing Approximate computing Monitoring Simulation SER Scan Encryption Security FDSOI Digital ATE Fault Injection Fault simulation OQPSK Phase noise Switches Particle detector Test cost reduction Fault attacks Test efficiency Fiabilité Random access memory SEU Transistors Education Power consumption Diffusion model Alternate testing Integrated circuit design Transient faults RF integrated circuits Fault injection ATPG Atmospheric neutrons Test and Security Multiple cell upset MCU BIST Power supplies Test Ensemble methods Through-silicon vias Process variability Logic gates Heavy ions One bit acquisition Stream Cipher Hardware