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Experimental Analysis of the Electromagnetic Instruction Skip Fault Model

Abstract : Microcontrollers storing valuable data or using security functions are vulnerable to fault injection attacks. Among the various types of faults, instruction skips induced at runtime proved to be effective against identification routines or encryption algorithms. Until recently, most research works assessed a fault model that consists in a single instruction skip, i.e. the ability to prevent one chosen instruction in a program from being executed. We question this fault model for EM fault injection on experimental basis and report the possibility to induce several consecutive instructions skips.
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Submitted on : Wednesday, May 13, 2020 - 4:19:19 PM
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Alexandre Menu, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud, Jean-Luc Danger. Experimental Analysis of the Electromagnetic Instruction Skip Fault Model. 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2020), Apr 2020, Marrakech, Morocco. ⟨10.1109/DTIS48698.2020.9081261⟩. ⟨hal-02572398⟩



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