Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, et al.. Delfines: Detecting Laser Fault Injection Attacks Via Digital Sensors. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023, pp.1-1. ⟨10.1109/TCAD.2023.3322623⟩. ⟨hal-04260842⟩

Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage. A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection Models. FDTC 2023 – Twentieth Workshop on Fault Diagnosis and Tolerance in Cryptography, Sep 2023, Prague, Czech Republic. ⟨hal-04210382⟩

Julien Béguinot, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Olivier Rioul, et al.. Reliability of ring oscillator PUFs with reduced helper data. 18th International Workshop on Security (IWSEC 2023), Aug 2023, Yokohama, Japan. ⟨hal-04136988⟩

Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, et al.. Testing and reliability enhancement of security primitives: Methodology and experimental validation. Microelectronics Reliability, 2023, 147, pp.115055. ⟨10.1016/j.microrel.2023.115055⟩. ⟨hal-04260803⟩

Julien Béguinot, Yi Liu, Olivier Rioul, Wei Cheng, Sylvain Guilley. Maximal leakage of masked implementations using Mrs. Gerber's lemma for min-entropy. IEEE International Symposium on Information Theory (ISIT 2023), IEEE, Jun 2023, Taipei, Taiwan. ⟨hal-04136987⟩

Dorian Bourgeoisat, Laurent Sauvage. A Genetic Algorithm for a Spectre Attack Agnostic to Branch Predictors. Seventh Workshop on Computer Architecture Research with RISC-V (CARRV 2023), Jun 2023, Orlanda (Florida), United States. ⟨hal-04210397⟩

Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. Aging-Induced Failure Prognosis via Digital Sensors. GLSVLSI '23: Great Lakes Symposium on VLSI 2023, Jun 2023, Knoxville TN USA, United States. pp.703-708, ⟨10.1145/3583781.3590204⟩. ⟨hal-04260871⟩

Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. Special Session: Security Verification & Testing for SR-Latch TRNGs. 2023 IEEE 41st VLSI Test Symposium (VTS), Apr 2023, San Diego, United States. pp.1-10, ⟨10.1109/VTS56346.2023.10140057⟩. ⟨hal-04260342⟩

Yi Liu, Julien Béguinot, Wei Cheng, Sylvain Guilley, Loïc Masure, et al.. Improved alpha-information bounds for higher-order masked cryptographic implementations. IEEE Information Theory Workshop (ITW 2023), IEEE, Apr 2023, Saint Malo, France. ⟨hal-04136985⟩

Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage. Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), Apr 2023, Antwerp, Belgium. pp.1-2, ⟨10.23919/DATE56975.2023.10137124⟩. ⟨hal-04260316⟩