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Journal Articles Review of Scientific Instruments Year : 2023

A mini scanning device for profiling charged beams


In this article we present the development of a mini scanner device to characterize the full transverse spatial density of a charged particle beam using computed tomography. The profiler consists of a wire mounted on a linear translator that can rotate around the beam. Tests were performed on a millimeter electron beam with 200 eV energy and 100 nA intensity, which allowed us to control and monitor both beam focusing and deflection.
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Dates and versions

hal-04155057 , version 1 (07-07-2023)
hal-04155057 , version 2 (28-08-2023)



Patrick Moretto-Capelle, Eric Panader, Laurent Polizzi, Jean-Philippe Champeaux. A mini scanning device for profiling charged beams. Review of Scientific Instruments, 2023, 94 (8), pp.083306. ⟨10.1063/5.0158663⟩. ⟨hal-04155057v2⟩
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